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Published in Electronic Library of Peter the Great Polytechnic University • Jan 1, 2019

NobleIDNI0P92W41R87S04

Authors:

Ð¢Ð°ÑÑÑÐ½Ð° Ð¡Ð¸Ð·ÐµÐ²Ð°

Abstract

Ð ÑÐ¿Ð¾Ñ Ñ Ð·Ð½Ð°Ð½Ð¸Ð¹ Ð¸Ð½ÑÐµÐ»Ð»ÐµÐºÑÑÐ°Ð»ÑÐ½ÑÐ¹ ÐºÐ°Ð¿Ð¸ÑÐ°Ð» ÑÑÐ°Ð» ÐºÐ»ÑÑÐµÐ²ÑÐ¼ ÑÐµÑÑÑÑÐ¾Ð¼ Ð´Ð»Ñ Ð¿ÑÐµÐ´Ð¿ÑÐ¸ÑÑÐ¸Ñ, ÑÑÐ¾Ð±Ñ ÑÐ¾Ñ ÑÐ°Ð½Ð¸ÑÑ Ð¸ ÑÐ»ÑÑÑÐ¸ÑÑ ÐºÐ¾Ð½ÐºÑÑÐµÐ½ÑÐ½Ð¾Ðµ Ð¿ÑÐµÐ¸Ð¼ÑÑÐµÑÑÐ²Ð¾. ÐÐ±ÑÐµÐºÑÐ¾Ð¼ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ñ ÑÐ²Ð»Ñ...

Subject

Measure (data warehouse)

Reliability (semiconductor)

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